Publikationen von Sinclair, Robert

Wegscheider, Werner, Eberl, Karl, Abstreiter, Gerhard, Cerva, Hans und Oppolzer, Helmut (1990) New relaxation mechanism in short period strained-layer superlattices. In: Sinclair, Robert, (ed.) High resolution electron microscopy of defects in materials: symposium held April 16.-18., 1990, San Francisco, California, USA. Materials Research Society symposium proceedings, 183. Materials Research Society, Pittsburgh, Pennsylvania, USA, S. 155. ISBN 1-558-99072-0. Volltext nicht vorhanden.