| Download ( PDF | 126kB) |
Owner only: item control page
Trapping and escape of negative ions from the surface of liquid 4He
Rayfield, G. W. and Schoepe, Wilfried (1971) Trapping and escape of negative ions from the surface of liquid 4He. Physics Letters, A 34 (2), pp. 133-134.Date of publication of this fulltext: 23 Dec 2010 10:26
Article
DOI to cite this document: 10.5283/epub.18882
Abstract
The lifetime of electrons deposited on the liquid surface of 4He was measured. It is smaller than 8 μs at 0.5 K and, as is concluded from its temperature dependence, governed by the electronic mobility parallel to the superfluid surface.
Alternative links to fulltext
Involved Institutions
Details
| Item type | Article | ||||
| Journal or Publication Title | Physics Letters, A | ||||
| Publisher: | Elsevier | ||||
|---|---|---|---|---|---|
| Volume: | 34 | ||||
| Number of Issue or Book Chapter: | 2 | ||||
| Page Range: | pp. 133-134 | ||||
| Date | 1971 | ||||
| Institutions | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Prof. Wilfried Schoepe | ||||
| Identification Number |
| ||||
| Dewey Decimal Classification | 500 Science > 530 Physics | ||||
| Status | Published | ||||
| Refereed | Unknown | ||||
| Created at the University of Regensburg | Unknown | ||||
| URN of the UB Regensburg | urn:nbn:de:bvb:355-epub-188821 | ||||
| Item ID | 18882 |
Export bibliographical data
Owner only: item control page
Download Statistics
Download Statistics