| Veröffentlichte Version Download ( PDF | 323kB) |
Application of the equipartition theorem to the thermal excitation of quartz tuning forks
Welker, Joachim, de Faria Elsner, Frederico und Giessibl, Franz J.
(2011)
Application of the equipartition theorem to the thermal excitation of quartz tuning forks.
Applied Physics Letters 99, 084102.
Veröffentlichungsdatum dieses Volltextes: 31 Aug 2011 07:44
Artikel
DOI zum Zitieren dieses Dokuments: 10.5283/epub.21966
Zusammenfassung
The deflection signal of a thermally excited force sensor of an atomic force microscope can be analyzed to gain important information about the detector noise and about the validity of the equipartion theorem of thermodynamics. Here, we measured the temperature dependence of the thermal amplitude of a tuning fork and compared it to the expected values based on the equipartition theorem. In doing ...
The deflection signal of a thermally excited force sensor of an atomic force microscope can be analyzed to gain important information about the detector noise and about the validity of the equipartion theorem of thermodynamics. Here, we measured the temperature dependence of the thermal amplitude of a tuning fork and compared it to the expected values based on the equipartition theorem. In doing so, we prove the validity of these assumptions in the temperature range from 140 K to 300 K. Furthermore, the application of the equipartition theorem to quartz tuning forks at liquid helium temperatures is discussed. (C) 2011 American Institute of Physics. [doi:10.1063/1.3627184]
Alternative Links zum Volltext
Beteiligte Einrichtungen
Details
| Dokumentenart | Artikel | ||||
| Titel eines Journals oder einer Zeitschrift | Applied Physics Letters | ||||
| Verlag: | AMER INST PHYSICS | ||||
|---|---|---|---|---|---|
| Ort der Veröffentlichung: | MELVILLE | ||||
| Band: | 99 | ||||
| Seitenbereich: | 084102 | ||||
| Datum | 2011 | ||||
| Institutionen | Physik > Institut für Experimentelle und Angewandte Physik > Lehrstuhl Professor Giessibl > Arbeitsgruppe Franz J. Giessibl | ||||
| Identifikationsnummer |
| ||||
| Klassifikation |
| ||||
| Stichwörter / Keywords | ATOMIC-FORCE MICROSCOPY; SENSOR; SURFACE; | ||||
| Dewey-Dezimal-Klassifikation | 500 Naturwissenschaften und Mathematik > 530 Physik | ||||
| Status | Veröffentlicht | ||||
| Begutachtet | Ja, diese Version wurde begutachtet | ||||
| An der Universität Regensburg entstanden | Ja | ||||
| URN der UB Regensburg | urn:nbn:de:bvb:355-epub-219669 | ||||
| Dokumenten-ID | 21966 |
Downloadstatistik
Downloadstatistik