Direkt zum Inhalt

Welker, Joachim ; Giessibl, Franz J.

Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy

Welker, Joachim and Giessibl, Franz J. (2012) Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy. Science 336 (608), pp. 444-449.

Date of publication of this fulltext: 16 May 2012 09:48
Article
DOI to cite this document: 10.5283/epub.24414


Abstract

We have measured the angular dependence of chemical bonding forces between a carbon monoxide molecule that is adsorbed to a copper surface and the terminal atom of the metallic tip of a combined scanning tunneling microscope and atomic force microscope. We provide tomographic maps of force and current as a function of distance that revealed the emergence of strongly directional chemical bonds as ...

We have measured the angular dependence of chemical bonding forces between a carbon monoxide molecule that is adsorbed to a copper surface and the terminal atom of the metallic tip of a combined scanning tunneling microscope and atomic force microscope. We provide tomographic maps of force and current as a function of distance that revealed the emergence of strongly directional chemical bonds as tip and sample approach. The force maps show pronounced single, dual, or triple minima depending on the orientation of the tip atom, whereas tunneling current maps showed a single minimum for all three tip conditions. We introduce an angular dependent model for the bonding energy that maps the observed experimental data for all observed orientations and distances.



Involved Institutions


Details

Item typeArticle
Journal or Publication TitleScience
Publisher:AMER ASSOC ADVANCEMENT SCIENCE
Place of Publication:WASHINGTON
Volume:336
Number of Issue or Book Chapter:608
Page Range:pp. 444-449
Date27 April 2012
InstitutionsPhysics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number
ValueType
10.1126/science.1219850DOI
KeywordsSCANNING-TUNNELING-MICROSCOPY; ELECTRONIC-STRUCTURE; GIANT CORRUGATIONS; SURFACE; RESOLUTION; MOLECULES; CO; SPECTROSCOPY; MANIPULATION; SILICON;
Dewey Decimal Classification500 Science > 530 Physics
StatusPublished
RefereedYes, this version has been refereed
Created at the University of RegensburgYes
URN of the UB Regensburgurn:nbn:de:bvb:355-epub-244147
Item ID24414

Export bibliographical data

Owner only: item control page

nach oben