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Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy
Welker, Joachim und Giessibl, Franz J.
(2012)
Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy.
Science 336 (608), S. 444-449.
Veröffentlichungsdatum dieses Volltextes: 16 Mai 2012 09:48
Artikel
DOI zum Zitieren dieses Dokuments: 10.5283/epub.24414
Zusammenfassung
We have measured the angular dependence of chemical bonding forces between a carbon monoxide molecule that is adsorbed to a copper surface and the terminal atom of the metallic tip of a combined scanning tunneling microscope and atomic force microscope. We provide tomographic maps of force and current as a function of distance that revealed the emergence of strongly directional chemical bonds as ...
We have measured the angular dependence of chemical bonding forces between a carbon monoxide molecule that is adsorbed to a copper surface and the terminal atom of the metallic tip of a combined scanning tunneling microscope and atomic force microscope. We provide tomographic maps of force and current as a function of distance that revealed the emergence of strongly directional chemical bonds as tip and sample approach. The force maps show pronounced single, dual, or triple minima depending on the orientation of the tip atom, whereas tunneling current maps showed a single minimum for all three tip conditions. We introduce an angular dependent model for the bonding energy that maps the observed experimental data for all observed orientations and distances.
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| Dokumentenart | Artikel | ||||
| Titel eines Journals oder einer Zeitschrift | Science | ||||
| Verlag: | AMER ASSOC ADVANCEMENT SCIENCE | ||||
|---|---|---|---|---|---|
| Ort der Veröffentlichung: | WASHINGTON | ||||
| Band: | 336 | ||||
| Nummer des Zeitschriftenheftes oder des Kapitels: | 608 | ||||
| Seitenbereich: | S. 444-449 | ||||
| Datum | 27 April 2012 | ||||
| Institutionen | Physik > Institut für Experimentelle und Angewandte Physik > Lehrstuhl Professor Giessibl > Arbeitsgruppe Franz J. Giessibl | ||||
| Identifikationsnummer |
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| Stichwörter / Keywords | SCANNING-TUNNELING-MICROSCOPY; ELECTRONIC-STRUCTURE; GIANT CORRUGATIONS; SURFACE; RESOLUTION; MOLECULES; CO; SPECTROSCOPY; MANIPULATION; SILICON; | ||||
| Dewey-Dezimal-Klassifikation | 500 Naturwissenschaften und Mathematik > 530 Physik | ||||
| Status | Veröffentlicht | ||||
| Begutachtet | Ja, diese Version wurde begutachtet | ||||
| An der Universität Regensburg entstanden | Ja | ||||
| URN der UB Regensburg | urn:nbn:de:bvb:355-epub-244147 | ||||
| Dokumenten-ID | 24414 |
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