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Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy
Welker, Joachim and Giessibl, Franz J.
(2012)
Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy.
Science 336 (608), pp. 444-449.
Date of publication of this fulltext: 16 May 2012 09:48
Article
DOI to cite this document: 10.5283/epub.24414
Abstract
We have measured the angular dependence of chemical bonding forces between a carbon monoxide molecule that is adsorbed to a copper surface and the terminal atom of the metallic tip of a combined scanning tunneling microscope and atomic force microscope. We provide tomographic maps of force and current as a function of distance that revealed the emergence of strongly directional chemical bonds as ...
We have measured the angular dependence of chemical bonding forces between a carbon monoxide molecule that is adsorbed to a copper surface and the terminal atom of the metallic tip of a combined scanning tunneling microscope and atomic force microscope. We provide tomographic maps of force and current as a function of distance that revealed the emergence of strongly directional chemical bonds as tip and sample approach. The force maps show pronounced single, dual, or triple minima depending on the orientation of the tip atom, whereas tunneling current maps showed a single minimum for all three tip conditions. We introduce an angular dependent model for the bonding energy that maps the observed experimental data for all observed orientations and distances.
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Details
| Item type | Article | ||||
| Journal or Publication Title | Science | ||||
| Publisher: | AMER ASSOC ADVANCEMENT SCIENCE | ||||
|---|---|---|---|---|---|
| Place of Publication: | WASHINGTON | ||||
| Volume: | 336 | ||||
| Number of Issue or Book Chapter: | 608 | ||||
| Page Range: | pp. 444-449 | ||||
| Date | 27 April 2012 | ||||
| Institutions | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl | ||||
| Identification Number |
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| Keywords | SCANNING-TUNNELING-MICROSCOPY; ELECTRONIC-STRUCTURE; GIANT CORRUGATIONS; SURFACE; RESOLUTION; MOLECULES; CO; SPECTROSCOPY; MANIPULATION; SILICON; | ||||
| Dewey Decimal Classification | 500 Science > 530 Physics | ||||
| Status | Published | ||||
| Refereed | Yes, this version has been refereed | ||||
| Created at the University of Regensburg | Yes | ||||
| URN of the UB Regensburg | urn:nbn:de:bvb:355-epub-244147 | ||||
| Item ID | 24414 |
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