Localization of the phantom force induced by the tunneling current

URN to cite this document:: urn:nbn:de:bvb:355-epub-252674
DOI to cite this document:: 10.5283/epub.25267

Wutscher, Thorsten ; Weymouth, Alfred J. ; Giessibl, Franz J.

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Date of publication of this fulltext: 05 Jul 2012 06:06

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Abstract

The phantom force is an apparently repulsive force, which can dominate the atomic contrast of an AFM image when a tunneling current is present. We described this effect with a simple resistive model, in which the tunneling current causes a voltage drop at the sample area underneath the probe tip. Because tunneling is a highly local process, the areal current density is quite high, which leads to ...