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Physical interpretation of frequency-modulation atomic force microscopy

Giessibl, Franz J. and Bielefeldt, Hartmut (2000) Physical interpretation of frequency-modulation atomic force microscopy. Physical Review B (PRB) 61 (15), pp. 9968-9971.

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Other URL: http://link.aps.org/doi/10.1103/PhysRevB.61.9968


Frequency modulation atomic force microscopy is a method for imaging the surface of metals, semiconductors and insulators in ultrahigh vacuum with true atomic resolution. The imaging signal in this technique is the frequency shift Δf of an oscillating cantilever with eigenfrequency f0, spring constant k and amplitude A, which is subject to tip-sample forces Fts. Here, we present analytical ...


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Item type:Article
Date:15 April 2000
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:BMBF 13N6918
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Dewey Decimal Classification:500 Science > 530 Physics
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Item ID:25271
Owner only: item control page


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