Physical interpretation of frequency-modulation atomic force microscopy

URN to cite this document:: urn:nbn:de:bvb:355-epub-252710
DOI to cite this document:: 10.5283/epub.25271

Giessibl, Franz J. ; Bielefeldt, Hartmut

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Date of publication of this fulltext: 10 Jul 2012 13:48

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Abstract

Frequency modulation atomic force microscopy is a method for imaging the surface of metals, semiconductors and insulators in ultrahigh vacuum with true atomic resolution. The imaging signal in this technique is the frequency shift Δf of an oscillating cantilever with eigenfrequency f0, spring constant k and amplitude A, which is subject to tip-sample forces Fts. Here, we present analytical ...