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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-252730
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.25273
Alternative Links zum Volltext:DOI
Zusammenfassung
In frequency-modulation atomic force microscopy the direct observable is the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods proposed by Sader and Jarvis (Sader-Jarvis method) and Giessibl (matrix method) are investigated with ...
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