Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

URN to cite this document:: urn:nbn:de:bvb:355-epub-252730
DOI to cite this document:: 10.5283/epub.25273

Welker, Joachim ; Illek, Esther ; Giessibl, Franz J.

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Date of publication of this fulltext: 05 Jul 2012 05:53

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Abstract

In frequency-modulation atomic force microscopy the direct observable is the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods proposed by Sader and Jarvis (Sader-Jarvis method) and Giessibl (matrix method) are investigated with ...