Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy

URN to cite this document:: urn:nbn:de:bvb:355-epub-252730

Welker, Joachim ; Illek, Esther ; Giessibl, Franz J.

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Date of publication of this fulltext: 05 Jul 2012 05:53

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Abstract

In frequency-modulation atomic force microscopy the direct observable is the frequency shift of an oscillating cantilever in a force field. This frequency shift is not a direct measure of the actual force, and thus, to obtain the force, deconvolution methods are necessary. Two prominent methods proposed by Sader and Jarvis (Sader–Jarvis method) and Giessibl (matrix method) are investigated with ...