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Phantom Force Induced by Tunneling Current: A Characterization on Si(111)
Weymouth, Alfred J.
, Wutscher, Thorsten, Welker, Joachim, Hofman, Thomas und Giessibl, Franz J.
(2011)
Phantom Force Induced by Tunneling Current: A Characterization on Si(111).
Physical Review Letters (PRL) 106 (22), 226801-1-226801-4.
Veröffentlichungsdatum dieses Volltextes: 05 Jul 2012 05:52
Artikel
DOI zum Zitieren dieses Dokuments: 10.5283/epub.25274
Zusammenfassung
Simultaneous measurements of tunneling current and atomic forces provide complementary atomic-scale data of the electronic and structural properties of surfaces and adsorbates. With these data, we characterize a strong impact of the tunneling current on the measured force on samples with limited conductivity. The effect is a lowering of the effective gap voltage through sample resistance which in ...
Simultaneous measurements of tunneling current and atomic forces provide complementary atomic-scale data of the electronic and structural properties of surfaces and adsorbates. With these data, we characterize a strong impact of the tunneling current on the measured force on samples with limited conductivity. The effect is a lowering of the effective gap voltage through sample resistance which in turn lowers the electrostatic attraction, resulting in an apparently repulsive force. This effect is expected to occur on other low-conductance samples, such as adsorbed molecules, and to strongly affect Kelvin probe measurements when tunneling occurs.
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| Dokumentenart | Artikel | ||||||||
| Titel eines Journals oder einer Zeitschrift | Physical Review Letters (PRL) | ||||||||
| Verlag: | AMER PHYSICAL SOC | ||||||||
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| Ort der Veröffentlichung: | COLLEGE PK | ||||||||
| Band: | 106 | ||||||||
| Nummer des Zeitschriftenheftes oder des Kapitels: | 22 | ||||||||
| Seitenbereich: | 226801-1-226801-4 | ||||||||
| Datum | 1 Juni 2011 | ||||||||
| Institutionen | Physik > Institut für Experimentelle und Angewandte Physik > Lehrstuhl Professor Giessibl > Arbeitsgruppe Franz J. Giessibl | ||||||||
| Identifikationsnummer |
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| Klassifikation |
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| Stichwörter / Keywords | SILICON (111)-(7X7) SURFACE; 7 X 7; CONTRAST INVERSION; ATOMIC-RESOLUTION; REAL SPACE; MICROSCOPY; TIP; VACUUM; | ||||||||
| Dewey-Dezimal-Klassifikation | 500 Naturwissenschaften und Mathematik > 530 Physik | ||||||||
| Status | Veröffentlicht | ||||||||
| Begutachtet | Ja, diese Version wurde begutachtet | ||||||||
| An der Universität Regensburg entstanden | Ja | ||||||||
| URN der UB Regensburg | urn:nbn:de:bvb:355-epub-252746 | ||||||||
| Dokumenten-ID | 25274 |
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