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Phantom Force Induced by Tunneling Current: A Characterization on Si(111)

URN to cite this document:
urn:nbn:de:bvb:355-epub-252746
Weymouth, Alfred J. ; Wutscher, Thorsten ; Welker, Joachim ; Hofman, Thomas ; Giessibl, Franz J.
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Date of publication of this fulltext: 05 Jul 2012 05:52


Abstract

Simultaneous measurements of tunneling current and atomic forces provide complementary atomic-scale data of the electronic and structural properties of surfaces and adsorbates. With these data, we characterize a strong impact of the tunneling current on the measured force on samples with limited conductivity. The effect is a lowering of the effective gap voltage through sample resistance which in ...

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