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- URN to cite this document:
- urn:nbn:de:bvb:355-epub-252767
- DOI to cite this document:
- 10.5283/epub.25276
Abstract
Theory predicts that the currents in scanning tunneling microscopy (STM) and the attractive forces measured in atomic force microscopy (AFM) are directly related. Atomic images obtained in an attractive AFM mode should therefore be redundant because they should be similar to STM. Here, we show that while the distance dependence of current and force is similar for graphite, constant-height AFM and ...
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