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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-252846
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.25284
Zusammenfassung
Manipulation of individual atoms and molecules by scanning probe microscopy offers the ability of controlled assembly at the single-atom scale. However, the driving forces behind atomic manipulation have not yet been measured. We used an atomic force microscope to measure the vertical and lateral forces exerted on individual adsorbed atoms or molecules by the probe tip. We found that the force ...
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