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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-253424
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.25342
Alternative Links zum Volltext:DOI
Zusammenfassung
True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency modulation atomic force microscopy. So far, the imaging parameters (i.e., eigenfrequency, stiffness and oscillation amplitude of the cantilever, frequency shift) which result in optimal spatial resolution for a given cantilever and sample have been found empirically. Here, we calculate the optimal ...
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