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Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

URN to cite this document:
Giessibl, Franz J. ; Bielefeldt, Hartmut ; Hembacher, Stefan ; Mannhart, Jochen
Date of publication of this fulltext: 13 Jul 2012 08:01


True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency modulation atomic force microscopy. So far, the imaging parameters (i.e., eigenfrequency, stiffness and oscillation amplitude of the cantilever, frequency shift) which result in optimal spatial resolution for a given cantilever and sample have been found empirically. Here, we calculate the optimal ...


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