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Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

Giessibl, Franz J., Bielefeldt, Hartmut, Hembacher, Stefan and Mannhart, Jochen (1999) Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy. Applied Surface Science 140 (3-4), pp. 352-357.

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True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency modulation atomic force microscopy. So far, the imaging parameters (i.e., eigenfrequency, stiffness and oscillation amplitude of the cantilever, frequency shift) which result in optimal spatial resolution for a given cantilever and sample have been found empirically. Here, we calculate the optimal ...


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Item type:Article
Date:February 1999
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:BMBF 13N6918
Identification Number:
07.79 LhPACS
61.16 ChPACS
87.64 DzPACS
34.20 CfPACS
Keywords:Atomic force microscopy; Frequency modulation atomic force microscopy; Dynamic force microscopy; Atomic resolution; Tip–sample interaction; Dissipation; Thermal noise; APN
Dewey Decimal Classification:500 Science > 530 Physics
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Item ID:25342
Owner only: item control page


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