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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-253446
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.25344
Alternative Links zum Volltext:DOI
Zusammenfassung
The forces acting on the substrate in intermittent-contact-mode (IC mode, tapping mode) atomic force microscopy are not accessible to a direct measurement. For an estimation of these forces, a simple analytical model is developed by considering only the shift of the cantilever resonance frequency caused by Hertzian (contact) forces. Based on the relationship between frequency shift and tip–sample ...
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