Go to content
UR Home

A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics

URN to cite this document:
urn:nbn:de:bvb:355-epub-253446
Bielefeldt, Hartmut ; Giessibl, Franz J.
[img]
Preview
PDF
(149kB)
Date of publication of this fulltext: 13 Jul 2012 07:59


Abstract

The forces acting on the substrate in intermittent-contact-mode (IC mode, tapping mode) atomic force microscopy are not accessible to a direct measurement. For an estimation of these forces, a simple analytical model is developed by considering only the shift of the cantilever resonance frequency caused by Hertzian (contact) forces. Based on the relationship between frequency shift and tip–sample ...

plus


Owner only: item control page
  1. Homepage UR

University Library

Publication Server

Contact:

Publishing: oa@ur.de

Dissertations: dissertationen@ur.de

Research data: daten@ur.de

Contact persons