A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics

URN to cite this document:: urn:nbn:de:bvb:355-epub-253446
DOI to cite this document:: 10.5283/epub.25344

Bielefeldt, Hartmut ; Giessibl, Franz J.

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Date of publication of this fulltext: 13 Jul 2012 07:59

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Abstract

The forces acting on the substrate in intermittent-contact-mode (IC mode, tapping mode) atomic force microscopy are not accessible to a direct measurement. For an estimation of these forces, a simple analytical model is developed by considering only the shift of the cantilever resonance frequency caused by Hertzian (contact) forces. Based on the relationship between frequency shift and tip–sample ...