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Influence of ridge geometry on lateral mode stability of (In/Al)GaN laser diodes
Schwarz, Uli, Pindl, M., Sturm, Evi, Furitsch, M., Leber, A., Miller, S., Lell, A. and Härle, V. (2005) Influence of ridge geometry on lateral mode stability of (In/Al)GaN laser diodes. phys. stat. sol. (a) 202, p. 261.Date of publication of this fulltext: 05 Aug 2009 13:40
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| Item type | Article |
| Journal or Publication Title | phys. stat. sol. (a) |
| Volume: | 202 |
|---|---|
| Page Range: | p. 261 |
| Date | 2005 |
| Institutions | Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Ulrich Schwarz |
| Dewey Decimal Classification | 500 Science > 530 Physics |
| Status | Published |
| Refereed | Yes, this version has been refereed |
| Created at the University of Regensburg | Yes |
| Item ID | 2593 |
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