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Weymouth, Alfred J. ; Hofmann, Thomas ; Giessibl, Franz J.

Quantifying Molecular Stiffness and Interaction with Lateral Force Microscopy

Weymouth, Alfred J. , Hofmann, Thomas and Giessibl, Franz J. (2014) Quantifying Molecular Stiffness and Interaction with Lateral Force Microscopy. Science 343 (6175), 1120-1-1120-5.

Date of publication of this fulltext: 06 Mar 2014 13:02
Article
DOI to cite this document: 10.5283/epub.29573


Abstract

The spatial resolution of atomic force microscopy (AFM) can be drastically increased by terminating the tip with a single carbon monoxide (CO) molecule. However, the CO molecule is not stiff, and lateral forces, such as those around the sides of molecules, distort images. This issue begs a larger question of how AFM can probe structures that are laterally weak. Lateral force microscopy (LFM) can ...

The spatial resolution of atomic force microscopy (AFM) can be drastically increased by terminating the tip with a single carbon monoxide (CO) molecule. However, the CO molecule is not stiff, and lateral forces, such as those around the sides of molecules, distort images. This issue begs a larger question of how AFM can probe structures that are laterally weak. Lateral force microscopy (LFM) can probe lateral stiffnesses that are not accessible to normal-force AFM, resulting in higher spatial resolution. With LFM, we determined the torsional spring constant of a CO-terminated tip molecule to be 0.24 newtons per meter. This value is less than that of a surface molecule and an example of a system whose stiffness is a product not only of bonding partners but also local environment.



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Details

Item typeArticle
Journal or Publication TitleScience
Publisher:AMER ASSOC ADVANCEMENT SCIENCE
Place of Publication:WASHINGTON
Volume:343
Number of Issue or Book Chapter:6175
Page Range:1120-1-1120-5
Date6 February 2014
InstitutionsPhysics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number
ValueType
10.1126/science.1249502DOI
KeywordsSCANNING TUNNELING MICROSCOPE; REAL-SPACE; ATOM; IDENTIFICATION; SPECTROSCOPY; RESOLUTION; SURFACES;
Dewey Decimal Classification500 Science > 530 Physics
StatusPublished
RefereedYes, this version has been refereed
Created at the University of RegensburgYes
URN of the UB Regensburgurn:nbn:de:bvb:355-epub-295739
Item ID29573

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