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Quantifying Molecular Stiffness and Interaction with Lateral Force Microscopy
Weymouth, Alfred J.
, Hofmann, Thomas and Giessibl, Franz J.
(2014)
Quantifying Molecular Stiffness and Interaction with Lateral Force Microscopy.
Science 343 (6175), 1120-1-1120-5.
Date of publication of this fulltext: 06 Mar 2014 13:02
Article
DOI to cite this document: 10.5283/epub.29573
Abstract
The spatial resolution of atomic force microscopy (AFM) can be drastically increased by terminating the tip with a single carbon monoxide (CO) molecule. However, the CO molecule is not stiff, and lateral forces, such as those around the sides of molecules, distort images. This issue begs a larger question of how AFM can probe structures that are laterally weak. Lateral force microscopy (LFM) can ...
The spatial resolution of atomic force microscopy (AFM) can be drastically increased by terminating the tip with a single carbon monoxide (CO) molecule. However, the CO molecule is not stiff, and lateral forces, such as those around the sides of molecules, distort images. This issue begs a larger question of how AFM can probe structures that are laterally weak. Lateral force microscopy (LFM) can probe lateral stiffnesses that are not accessible to normal-force AFM, resulting in higher spatial resolution. With LFM, we determined the torsional spring constant of a CO-terminated tip molecule to be 0.24 newtons per meter. This value is less than that of a surface molecule and an example of a system whose stiffness is a product not only of bonding partners but also local environment.
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| Item type | Article | ||||
| Journal or Publication Title | Science | ||||
| Publisher: | AMER ASSOC ADVANCEMENT SCIENCE | ||||
|---|---|---|---|---|---|
| Place of Publication: | WASHINGTON | ||||
| Volume: | 343 | ||||
| Number of Issue or Book Chapter: | 6175 | ||||
| Page Range: | 1120-1-1120-5 | ||||
| Date | 6 February 2014 | ||||
| Institutions | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl | ||||
| Identification Number |
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| Keywords | SCANNING TUNNELING MICROSCOPE; REAL-SPACE; ATOM; IDENTIFICATION; SPECTROSCOPY; RESOLUTION; SURFACES; | ||||
| Dewey Decimal Classification | 500 Science > 530 Physics | ||||
| Status | Published | ||||
| Refereed | Yes, this version has been refereed | ||||
| Created at the University of Regensburg | Yes | ||||
| URN of the UB Regensburg | urn:nbn:de:bvb:355-epub-295739 | ||||
| Item ID | 29573 |
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