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Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures

Pielmeier, Florian, Meuer, Daniel, Schmid, Daniel R., Strunk, Christoph and Giessibl, Franz J. (2014) Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures. Beilstein Journal of Nanotechnology (5), pp. 407-412.

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Other URL: http://www.beilstein-journals.org/bjnano/single/articleFullText.htm?publicId=2190-4286-5-48, http://www.beilstein-journals.org/bjnano/content/pdf/2190-4286-5-48.pdf, http://www.ncbi.nlm.nih.gov/pubmed/24778967


Abstract

In frequency modulation atomic force microscopy (FM-AFM) the stability of the eigenfrequency of the force sensor is of key importance for highest precision force measurements. Here, we study the influence of temperature changes on the resonance frequency of force sensors made of quartz, in a temperature range from 4.8–48 K. The sensors are based on the qPlus and length extensional principle. The ...

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Item type:Article
Date:4 April 2014
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:SFB 689: Spinphänomene in reduzierten Dimensionen
Identification Number:
ValueType
10.3762/bjnano.5.48DOI
Keywords:AFM; frequency drift; length extensional resonator; needle sensor; qPlus sensor; quartz
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:29772
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