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Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures

Pielmeier, Florian ; Meuer, Daniel ; Schmid, Daniel R. ; Strunk, Christoph ; Giessibl, Franz J.



Abstract

In frequency modulation atomic force microscopy (FM-AFM) the stability of the eigenfrequency of the force sensor is of key importance for highest precision force measurements. Here, we study the influence of temperature changes on the resonance frequency of force sensors made of quartz, in a temperature range from 4.8–48 K. The sensors are based on the qPlus and length extensional principle. The ...

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