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CO Tip Functionalization Inverts Atomic Force Microscopy
Contrast via Short-Range Electrostatic Forces

URN to cite this document:
urn:nbn:de:bvb:355-epub-298336
Schneiderbauer, Maximilian ; Emmrich, Matthias ; Weymouth, Alfred J. ; Giessibl, Franz J.
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Date of publication of this fulltext: 24 Apr 2014 12:01



Abstract

We investigate insulating Cu2N islands grown on Cu(100) by means of combined scanning tunneling microscopy and atomic force microscopy with two vastly different tips: a bare metal tip and a CO-terminated tip. We use scanning tunneling microscopy data as proposed by Choi, Ruggiero, and Gupta to unambiguously identify atomic positions. Atomic force microscopy images taken with the two different ...

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