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Probing Charges on the Atomic Scale by Means of Atomic Force Microscopy

Albrecht, F., Repp, Jascha , Fleischmann, M., Scheer, M., Ondráček, M. and Jelínek, P. (2015) Probing Charges on the Atomic Scale by Means of Atomic Force Microscopy. Physical Review Letters 115, 076101.

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Date of publication of this fulltext: 20 Aug 2015 10:25

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Abstract

Kelvin probe force spectroscopy was used to characterize the charge distribution of individual molecules with polar bonds. Whereas this technique represents the charge distribution with moderate resolution for large tip-molecule separations, it fails for short distances. Here, we introduce a novel local force spectroscopy technique which allows one to better disentangle electrostatic from other ...

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Item type:Article
Date:13 August 2015
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Jascha Repp
Chemistry and Pharmacy > Institut für Anorganische Chemie > Chair Prof. Dr. Manfred Scheer
Projects:GRK 1570, Elektronische Eigenschaften von Nanostrukturen auf Kohlenstoff-Basis
Identification Number:
ValueType
10.1103/PhysRevLett.115.076101DOI
Dewey Decimal Classification:500 Science > 530 Physics
500 Science > 540 Chemistry & allied sciences
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:32349
Owner only: item control page

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