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Probing Charges on the Atomic Scale by Means of Atomic Force Microscopy

Albrecht, F., Repp, Jascha , Fleischmann, M., Scheer, M., Ondráček, M. and Jelínek, P. (2015) Probing Charges on the Atomic Scale by Means of Atomic Force Microscopy. Physical Review Letters 115, 076101.

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Kelvin probe force spectroscopy was used to characterize the charge distribution of individual molecules with polar bonds. Whereas this technique represents the charge distribution with moderate resolution for large tip-molecule separations, it fails for short distances. Here, we introduce a novel local force spectroscopy technique which allows one to better disentangle electrostatic from other ...


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Item type:Article
Date:13 August 2015
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Jascha Repp
Chemistry and Pharmacy > Institut für Anorganische Chemie > Chair Prof. Dr. Manfred Scheer
Projects:GRK 1570, Elektronische Eigenschaften von Nanostrukturen auf Kohlenstoff-Basis
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Dewey Decimal Classification:500 Science > 530 Physics
500 Science > 540 Chemistry & allied sciences
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:32349
Owner only: item control page


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