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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-323625
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.32362
Zusammenfassung
Scanning probe microscopy can be used to probe the internal atomic structure of flat organic molecules. This technique requires an unreactive tip and has, until now, been demonstrated only at liquid helium and liquid nitrogen temperatures. We demonstrate intramolecular and intermolecular force contrast at room temperature on PTCDA molecules adsorbed on a Ag/Si(111)−(3√×3√) surface. The ...
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