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- URN to cite this document:
- urn:nbn:de:bvb:355-epub-337993
- DOI to cite this document:
- 10.5283/epub.33799
Abstract
Achieving a high intensity in inelastic scanning tunneling spectroscopy (IETS) is important for precise measurements. The intensity of the IETS signal can vary by up to a factor of 3 for various tips without an apparent reason accessible by scanning tunneling microscopy (STM) alone. Here, we show that combining STM and IETS with atomic force microscopy enables carbon monoxide front-atom ...
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