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The effect of sample resistivity on Kelvin probe force microscopy

Weymouth, Alfred Jay and Giessibl, Franz J. (2012) The effect of sample resistivity on Kelvin probe force microscopy. Applied Physics Letters 101, pp. 213105-1.

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Abstract

Kelvin probe force microscopy (KPFM) is a powerful technique to probe the local electronic structure of materials with atomic force microscopy. One assumption often made is that the applied bias drops fully in the tip-sample junction. We have recently identified an effect, the Phantom force, which can be explained by an ohmic voltage drop near the tip-sample junction causing a reduction of the ...

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Item type:Article
Date:21 November 2012
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:GRK 1570, Elektronische Eigenschaften von Nanostrukturen auf Kohlenstoff-Basis
Identification Number:
ValueType
10.1063/1.4766185DOI
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:33806
Owner only: item control page

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