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The effect of sample resistivity on Kelvin probe force microscopy

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Weymouth, Alfred Jay ; Giessibl, Franz J.
License: Allianz- bzw. Nationallizenz
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Date of publication of this fulltext: 27 May 2016 05:47


Kelvin probe force microscopy (KPFM) is a powerful technique to probe the local electronic structure of materials with atomic force microscopy. One assumption often made is that the applied bias drops fully in the tip-sample junction. We have recently identified an effect, the Phantom force, which can be explained by an ohmic voltage drop near the tip-sample junction causing a reduction of the ...


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