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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-338281
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.33828
Zusammenfassung
Achieving high resolution under ultrahigh-vacuum conditions with the force microscope can be difficult for reactive surfaces, where the interaction forces between the tip and the samples can be relatively large. A force detection scheme that makes use of a modified cantilever beam and senses the force gradient through frequency modulation is described. The reconstructed silicon (111)-(7x7) ...
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