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Atomic Force Microscopy-(7x7) Surface by Atomic Force Microscopy

Giessibl, Franz J. (1995) Atomic Force Microscopy-(7x7) Surface by Atomic Force Microscopy. Science 267 (5194), pp. 68-71.

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Date of publication of this fulltext: 31 May 2016 08:20

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Other URL: http://www.ncbi.nlm.nih.gov/pubmed/17840059


Abstract

Achieving high resolution under ultrahigh-vacuum conditions with the force microscope can be difficult for reactive surfaces, where the interaction forces between the tip and the samples can be relatively large. A force detection scheme that makes use of a modified cantilever beam and senses the force gradient through frequency modulation is described. The reconstructed silicon (111)-(7x7) ...

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Item type:Article
Date:6 January 1995
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1126/science.267.5194.68DOI
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Item ID:33828
Owner only: item control page

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