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Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy

Ooe, Hiroaki, Kirpal, Dominik, Wastl, Daniel S., Weymouth, Alfred J. , Toyoko, Arai and Giessibl, Franz J. (2016) Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy. Applied Physics Letters 109, p. 141603.

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Date of publication of this fulltext: 21 Nov 2016 12:33

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Abstract

In bimodal frequency modulation atomic force microscopy (FM-AFM), two flexural modes are excited simultaneously. We show atomically resolved images of KBr(100) in ambient conditions in both modes that display a strong correlation between the image quality and amplitude. We define the sum amplitude as the sum of the amplitudes of both modes. When the sum amplitude becomes larger than about 100 pm, ...

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Item type:Article
Date:20 May 2016
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:GRK 1570, Elektronische Eigenschaften von Nanostrukturen auf Kohlenstoff-Basis
Identification Number:
ValueType
10.1063/1.4964125DOI
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Item ID:34861
Owner only: item control page

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