Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy

URN to cite this document:: urn:nbn:de:bvb:355-epub-348619
DOI to cite this document:: 10.5283/epub.34861

Ooe, Hiroaki ; Kirpal, Dominik ; Wastl, Daniel S. ; Weymouth, Alfred J.

; Toyoko, Arai

; Giessibl, Franz J.

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Date of publication of this fulltext: 21 Nov 2016 12:33

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Abstract

In bimodal frequency modulation atomic force microscopy (FM-AFM), two flexural modes are excited simultaneously. We show atomically resolved images of KBr(100) in ambient conditions in both modes that display a strong correlation between the image quality and amplitude. We define the sum amplitude as the sum of the amplitudes of both modes. When the sum amplitude becomes larger than about 100 pm, ...