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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-452232
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.45223
Dies ist die aktuelle Version dieses Eintrags.
Zusammenfassung
Raman spectroscopy is a precious tool for the characterization of van der Waals materials, e.g. for the determination of the layer number in thin exfoliated flakes. For sensitive materials, however, this method can be dramatically invasive. In particular, the light intensity required to obtain a significant Raman signal is sufficient to immediately photo-oxidize few-layer thick metallic van der ...