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Probing the Nature of Chemical Bonds by Atomic Force Microscopy
Giessibl, Franz J.
(2021)
Probing the Nature of Chemical Bonds by Atomic Force Microscopy.
Molecules 26 (13), S. 4068.
Veröffentlichungsdatum dieses Volltextes: 12 Jul 2021 06:06
Artikel
DOI zum Zitieren dieses Dokuments: 10.5283/epub.46298
Zusammenfassung
The nature of the chemical bond is important in all natural sciences, ranging from biology to chemistry, physics and materials science. The atomic force microscope (AFM) allows to put a single chemical bond on the test bench, probing its strength and angular dependence. We review experimental AFM data, covering precise studies of van-der-Waals-, covalent-, ionic-, metallic- and hydrogen bonds as ...
The nature of the chemical bond is important in all natural sciences, ranging from biology to chemistry, physics and materials science. The atomic force microscope (AFM) allows to put a single chemical bond on the test bench, probing its strength and angular dependence. We review experimental AFM data, covering precise studies of van-der-Waals-, covalent-, ionic-, metallic- and hydrogen bonds as well as bonds between artificial and natural atoms. Further, we discuss some of the density functional theory calculations that are related to the experimental studies of the chemical bonds. A description of frequency modulation AFM, the most precise AFM method, discusses some of the experimental challenges in measuring bonding forces. In frequency modulation AFM, forces between the tip of an oscillating cantilever change its frequency. Initially, cantilevers were made mainly from silicon. Most of the high precision measurements of bonding strengths by AFM became possible with a technology transfer from the quartz watch technology to AFM by using quartz-based cantilevers ("qPlus force sensors"), briefly described here.
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| Dokumentenart | Artikel | ||||
| Titel eines Journals oder einer Zeitschrift | Molecules | ||||
| Verlag: | MDPI | ||||
|---|---|---|---|---|---|
| Ort der Veröffentlichung: | BASEL | ||||
| Band: | 26 | ||||
| Nummer des Zeitschriftenheftes oder des Kapitels: | 13 | ||||
| Seitenbereich: | S. 4068 | ||||
| Datum | 3 Juli 2021 | ||||
| Institutionen | Physik > Institut für Experimentelle und Angewandte Physik > Lehrstuhl Professor Giessibl > Arbeitsgruppe Franz J. Giessibl | ||||
| Identifikationsnummer |
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| Stichwörter / Keywords | SILICON (111)-(7X7) SURFACE; FREQUENCY-SHIFTS; RESOLUTION; IDENTIFICATION; ADSORPTION; ORBITALS; SENSOR; SPACE; chemical bond; covalent bond; ionic bond; hydrogen bond; metallic bond; hybridization; atomic force microscopy | ||||
| Dewey-Dezimal-Klassifikation | 500 Naturwissenschaften und Mathematik > 530 Physik | ||||
| Status | Veröffentlicht | ||||
| Begutachtet | Ja, diese Version wurde begutachtet | ||||
| An der Universität Regensburg entstanden | Ja | ||||
| URN der UB Regensburg | urn:nbn:de:bvb:355-epub-462982 | ||||
| Dokumenten-ID | 46298 |
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