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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-509595
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.50959
Zusammenfassung
In lateral force microscopy (LFM), implemented as frequency-modulation atomic force microscopy, the tip oscillates parallel to the surface. Existing amplitude calibration methods are not applicable for mechanically excited LFM sensors at low temperature. Moreover, a slight angular offset of the oscillation direction (tilt) has a significant influence on the acquired data. To determine the ...
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