Determining amplitude and tilt of a lateral force microscopy sensor

URN to cite this document:: urn:nbn:de:bvb:355-epub-509595
DOI to cite this document:: 10.5283/epub.50959

Gretz, Oliver

; Weymouth, Alfred J.

; Holzmann, Thomas ; Pürckhauer, Korbinian

; Giessibl, Franz J.

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Date of publication of this fulltext: 04 Nov 2021 06:14

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Abstract

In lateral force microscopy (LFM), implemented as frequency-modulation atomic force microscopy, the tip oscillates parallel to the surface. Existing amplitude calibration methods are not applicable for mechanically excited LFM sensors at low temperature. Moreover, a slight angular offset of the oscillation direction (tilt) has a significant influence on the acquired data. To determine the ...