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Non-contact lateral force microscopy
Weymouth, Alfred J.
(2017)
Non-contact lateral force microscopy.
Journal of Physics: Condensed Matter 29 (32), p. 323001.
Date of publication of this fulltext: 04 Nov 2021 06:37
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| Item type | Article | ||||
| Journal or Publication Title | Journal of Physics: Condensed Matter | ||||
| Publisher: | IOP Publishing | ||||
|---|---|---|---|---|---|
| Volume: | 29 | ||||
| Number of Issue or Book Chapter: | 32 | ||||
| Page Range: | p. 323001 | ||||
| Date | 17 July 2017 | ||||
| Institutions | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl | ||||
| Identification Number |
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| Keywords | atomic force microscopy, scanning probe microscopy, lateral force microscopy, surface science | ||||
| Dewey Decimal Classification | 500 Science > 530 Physics | ||||
| Status | Published | ||||
| Refereed | Yes, this version has been refereed | ||||
| Created at the University of Regensburg | Partially | ||||
| Item ID | 50962 |
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