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The qPlus sensor, a powerful core for the atomic force microscope

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Giessibl, Franz J.
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Date of publication of this fulltext: 05 Nov 2021 05:28


Atomic force microscopy (AFM) was introduced in 1986 and has since made its way into surface science, nanoscience, chemistry, biology, and material science as an imaging and manipulating tool with a rising number of applications. AFM can be employed in ambient and liquid environments as well as in vacuum and at low and ultralow temperatures. The technique is an offspring of scanning tunneling ...


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