Refinement of anomalous dispersion correction parameters in single-crystal structure determinations

URN to cite this document:: urn:nbn:de:bvb:355-epub-529382
DOI to cite this document:: 10.5283/epub.52938

Meurer, Florian

; Dolomanov, Oleg V. ; Hennig, Christoph

; Peyerimhoff, Norbert

; Kleemiss, Florian

; Puschmann, Horst ; Bodensteiner, Michael

License: Creative Commons Attribution 4.0
PDF - Published Version
(639kB)

Date of publication of this fulltext: 29 Sep 2022 07:51

Alternative links to fulltext:DOI Publisher

Details

Preview

Indexed in

Export bibliographical data

Abstract

Correcting for anomalous dispersion is part of any refinement of an X-ray diffraction crystal structure determination. The procedure takes the inelastic scattering in the diffraction experiment into account. This X-ray absorption effect is specific to each chemical compound and is particularly sensitive to radiation energies in the region of the absorption edges of the elements in the compound. ...