PDF - Published Version öffentlich ab 1.11.2024 (8MB) - Repository staff only |
- URN to cite this document:
- urn:nbn:de:bvb:355-epub-550046
- DOI to cite this document:
- 10.5283/epub.55004
Abstract
Atomic force microscopy (AFM) that can be simultaneously performed with scanning tunneling microscopy (STM) using metallic tips attached to self-sensing quartz cantilevers (qPlus sensors) has advanced the field of surface science by allowing for unprecedented spatial resolution under ultrahigh vacuum conditions. Performing simultaneous AFM and STM with atomic resolution in an electrochemical cell ...
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