Atomic force microscopy with qPlus sensors

URN to cite this document:: urn:nbn:de:bvb:355-epub-578421
DOI to cite this document:: 10.5283/epub.57842

Giessibl, Franz J.

License: Creative Commons Attribution 4.0
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Date of publication of this fulltext: 05 Mar 2024 06:42

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Abstract

Atomic force microscopy is one of the most important tools in nanoscience. It employs an atomic probe that can resolve surfaces with atomic and subatomic spatial resolution and manipulate atoms. The qPlus sensor is a quartz-based self-sensing cantilever with a high stiffness that, in contrast to Si cantilevers, allows to oscillate at atomic radius amplitudes in the proximity of reactive surfaces ...