Go to content
UR Home

Atomic force microscopy with qPlus sensors

URN to cite this document:
urn:nbn:de:bvb:355-epub-578421
DOI to cite this document:
10.5283/epub.57842
Giessibl, Franz J.
[img]License: Creative Commons Attribution 4.0
PDF - Published Version
(2MB)
Date of publication of this fulltext: 05 Mar 2024 06:42

This publication is part of the DEAL contract with Springer.


Abstract

Atomic force microscopy is one of the most important tools in nanoscience. It employs an atomic probe that can resolve surfaces with atomic and subatomic spatial resolution and manipulate atoms. The qPlus sensor is a quartz-based self-sensing cantilever with a high stiffness that, in contrast to Si cantilevers, allows to oscillate at atomic radius amplitudes in the proximity of reactive surfaces ...

plus


Owner only: item control page
  1. Homepage UR

University Library

Publication Server

Contact:

Publishing: oa@ur.de
0941 943 -4239 or -69394

Dissertations: dissertationen@ur.de
0941 943 -3904

Research data: datahub@ur.de
0941 943 -5707

Contact persons