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Atomic force microscopy with qPlus sensors

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Giessibl, Franz J.
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Date of publication of this fulltext: 05 Mar 2024 06:42

This publication is part of the DEAL contract with Springer.


Atomic force microscopy is one of the most important tools in nanoscience. It employs an atomic probe that can resolve surfaces with atomic and subatomic spatial resolution and manipulate atoms. The qPlus sensor is a quartz-based self-sensing cantilever with a high stiffness that, in contrast to Si cantilevers, allows to oscillate at atomic radius amplitudes in the proximity of reactive surfaces ...


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