Schattschneider, Peter 
; Stöger-Pollach, Michael ; Rubino, Stefano ; Sperl, Matthias ; Hurm, Christian ; Zweck, Josef ; Rusz, Ján
Alternative Links zum Volltext:DOIVerlag
| Dokumentenart: | Artikel |
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| Titel eines Journals oder einer Zeitschrift: | Physical Review B |
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| Verlag: | AMER PHYSICAL SOC |
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| Ort der Veröffentlichung: | COLLEGE PK |
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| Band: | 78 |
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| Nummer des Zeitschriftenheftes oder des Kapitels: | 10 |
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| Datum: | 2008 |
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| Institutionen: | Physik > Institut für Experimentelle und Angewandte Physik |
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| Identifikationsnummer: | | Wert | Typ |
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| 10.1103/PhysRevB.78.104413 | DOI |
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| Stichwörter / Keywords: | POLARIZED X-RAYS; ELECTRON-MICROSCOPE; SPECTROMICROSCOPY; HOLOGRAPHY; |
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| Dewey-Dezimal-Klassifikation: | 500 Naturwissenschaften und Mathematik > 530 Physik |
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| Status: | Veröffentlicht |
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| Begutachtet: | Ja, diese Version wurde begutachtet |
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| An der Universität Regensburg entstanden: | Ja |
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| Dokumenten-ID: | 67904 |
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Zusammenfassung
Magnetic circular dichroism (MCD) is a standard technique for the study of magnetic properties of materials in synchrotron beamlines. We present here a scattering geometry in the transmission electron microscope through which MCD can be observed with unprecedented spatial resolution. A convergent electron beam is used to scan a cross sectional preparation of a Fe/Au multilayer sample. Differences ...
Zusammenfassung
Magnetic circular dichroism (MCD) is a standard technique for the study of magnetic properties of materials in synchrotron beamlines. We present here a scattering geometry in the transmission electron microscope through which MCD can be observed with unprecedented spatial resolution. A convergent electron beam is used to scan a cross sectional preparation of a Fe/Au multilayer sample. Differences in the energy-loss spectra induced by the magnetic moments of the Fe atoms can be resolved with a resolution of better than 2 nm. This is a breakthrough achievement when compared both to the previous energy-loss MCD resolution (200 nm) or the best x-ray MCD experiments (approximately 20 nm).
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