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Strain analysis of a quantum-wire system produced by cleaved edge overgrowth using grazing incidence x-ray diffraction

Sztucki, M. ; Schülli, T. U. ; Metzger, T. H. ; Chamard, V. ; Schuster, R. ; Schuh, D.



Zusammenfassung

A GaAs surface layer of 10 nm thickness was grown on the cleaved edge of an In0.1Al0.9As/Al0.33Ga0.67As multilayer in order to induce a lateral periodic strain modulation. We apply surface sensitive grazing incidence x-ray diffraction to distinguish between compositional/morphological and purely strain induced modulations. The experimentally determined strain profile is confirmed by ...

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