Startseite UR

Lateral Force Microscopy to study in-plane interactions next to adsorbed molecules

Nam, Shinjae ; Weymouth, Alfred J. ; Giessibl, Franz J.



Zusammenfassung

Lateral Force Microscopy (LFM), a variant of Atomic Force Microscopy (AFM), is well-suited for quantifying in-plane forces near an adsorbed molecule. Understanding these forces is crucial for understanding processes like adsorption, friction, and molecular self-assembly. Approaching closer to the sides of adsorbates requires careful consideration of the interaction with the tip. Notably, LFM ...

plus


Nur für Besitzer und Autoren: Kontrollseite des Eintrags
  1. Universität

Universitätsbibliothek

Publikationsserver

Kontakt:

Publizieren: oa@ur.de
0941 943 -4239 oder -69394

Dissertationen: dissertationen@ur.de
0941 943 -3904

Forschungsdaten: datahub@ur.de
0941 943 -5707

Ansprechpartner