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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-791984
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.79198
Zusammenfassung
Many important phenomena in quantum devices are dynamic, meaning that they cannot be studied using time-averaged measurements alone. Experiments that measure such transient effects are collectively known as fast readout. One of the most useful techniques in fast electrical readout is radio-frequency reflectometry, which can measure changes in impedance (both resistive and reactive) even when ...
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