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KPI-Driven Visualizations for Root Cause Analysis in Manufacturing Processes
Mucha, Kacper, Böhmer, Kristof and Leitner, Maria
(2026)
KPI-Driven Visualizations for Root Cause Analysis in Manufacturing Processes.
In: Enterprise Design, Operations, and Computing. EDOC 2025 Workshops, September 9–12, 2025, Lisbon, Portugal.
Date of publication of this fulltext: 14 Jul 2026 04:25
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| Item type | Conference or workshop item (Paper) |
| ISBN | 978-3-032-16233-5, 978-3-032-16234-2 |
| Title of Book: | Enterprise Design, Operations, and Computing. EDOC 2025 Workshops |
|---|---|
| Publisher: | Springer |
| Place of Publication: | Cham |
| Other Series: | Lecture Notes in Business Information Processing |
| Volume: | 571 |
| Page Range: | pp. 474-489 |
| Date | 2026 |
| Institutions | Informatics and Data Science Informatics and Data Science > Department Information Systems Informatics and Data Science > Department Information Systems > Chair of Artificial Inteligence in IT Security (Prof. Dr. Maria Leitner) |
| Keywords | Anomaly Detection, Manufacturing, Process Mining, Root Cause Analysis |
| Dewey Decimal Classification | 000 Computer science, information & general works > 004 Computer science 300 Social sciences > 330 Economics |
| Status | Published |
| Refereed | Yes, this version has been refereed |
| Created at the University of Regensburg | Partially |
| Item ID | 79772 |
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