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2001
Giessibl, Franz J., Hembacher, Stefan, Bielefeldt, Hartmut und Mannhart, Jochen
(2001)
Imaging silicon by atomic force microscopy with crystallographically oriented tips.
Applied Physics A: Materials Science & Processing 72 (Suppl1), S. 15-17.
Giessibl, Franz J.
(2001)
A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy.
Applied Physics Letters 78 (1), S. 123-125.