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Plechinger, Gerd, Mann, J., Preciado, E., Barroso, D., Nguyen, A., Eroms, Jonathan
, Schueller, Christian, Bartels, Ludwig and Korn, Tobias
(2014)
A direct comparison of CVD-grown and exfoliated MoS2 using optical spectroscopy.
Semiconductor Science and Technology 29 (6), 064008.
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