Entries of Ebersberger, Bernd on the publication server
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2001
Olbrich, Alexander, Ebersberger, Bernd, Boit, Christian, Vancea, Johann, Hoffmann, Horst, Altmann, Hans, Gieres, Guenther and Wecker, Joachim
(2001)
Oxide thickness mapping of ultrathin Al2O3 at nanometer scale with conducting atomic force microscopy.
Applied Physics Letters 78 (19), pp. 2934-2936.
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