Entries of Nelhiebel, M. on the publication server
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Schwab, S., Jung, J., Gruber, S., Bauer, M., Miethaner, S., Nelhiebel, M. and Hutter, H.
(2016)
Investigation of Electric Field Induced Ion Migration in Semiconductor Encapsulation Materials without the Interference of Electron Conductivity.
ECS Journal of Solid State Science and Technology 5 (10), N72-N76.
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