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Entries of Nelhiebel, M. on the publication server

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Schwab, S., Jung, J., Gruber, S., Bauer, M., Miethaner, S., Nelhiebel, M. and Hutter, H. (2016) Investigation of Electric Field Induced Ion Migration in Semiconductor Encapsulation Materials without the Interference of Electron Conductivity. ECS Journal of Solid State Science and Technology 5 (10), N72-N76. Fulltext not available.

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