Entries of Nelhiebel, M. on the publication server

Schwab, S., Jung, J., Gruber, S., Bauer, M., Miethaner, S., Nelhiebel, M. and Hutter, H. (2016) Investigation of Electric Field Induced Ion Migration in Semiconductor Encapsulation Materials without the Interference of Electron Conductivity. ECS Journal of Solid State Science and Technology 5 (10), N72-N76. Fulltext not available.