Entries of Qiu, Jinglan on the publication server
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2021
Kirpal, Dominik, Qiu, Jinglan 
, Pürckhauer, Korbinian, Weymouth, Alfred J. , Metz, Michael and Giessibl, Franz J.
(2021)
Biaxial atomically resolved force microscopy based on a qPlus sensor operated simultaneously in the first flexural and length extensional modes.
Review of Scientific Instruments 92 (4), 043703.