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2012
Jönen, H, Bremers, H, Rossow, U, Langer, T, Kruse, A, Hoffmann, L, Thalmair, J, Zweck, J, Schwaiger, S, Scholz, F and Hangleiter, A 
(2012)
Analysis of indium incorporation in non- and semipolar GaInN QW structures: comparing x-ray diffraction and optical properties.
Semiconductor Science and Technology 27 (2), 024013.
Fulltext not available.
(2012)
Analysis of indium incorporation in non- and semipolar GaInN QW structures: comparing x-ray diffraction and optical properties.
Semiconductor Science and Technology 27 (2), 024013.
Fulltext not available.