Entries of Toyoko, Arai on the publication server
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2016
Ooe, Hiroaki, Kirpal, Dominik, Wastl, Daniel S., Weymouth, Alfred J. 
, Toyoko, Arai and Giessibl, Franz J.
(2016)
Amplitude dependence of image quality in atomically-resolved bimodal atomic force microscopy.
Applied Physics Letters 109, p. 141603.