Entries of Valakh, Mikhail Y. on the publication server
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2003
Ganichev, Sergey
(2003)
Ionization of impurities in semiconductors by intense FIR radiation.
In: Svechnikov, Sergey V. and Valakh, Mikhail Y., (eds.)
Selected Papers on Optics and Photonics: Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics.
Proceedings of SPIE, 5024.
SPIE, Bellingham, Washington, pp. 12-23.
ISBN 0819448257; 9780819448255.
Fulltext not available.
Ganichev, Sergey
(2003)
Ionization of impurities in semiconductors by intense FIR radiation.
In: Svechnikov, Sergey V. and Valakh, Mikhail Y., (eds.)
Selected papers on optics and photonics: optical diagnostics of materials and devices for opto-, micro-, and quantum electronics.
SPIE proceedings series, 5024.
SPIE, Bellingham, Washington, pp. 12-23.
ISBN 0-8194-4825-7.
Fulltext not available.