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Publications by Zankl, Tobias

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Hanekamp, Patrick, Raith, Timo, Iffelsberger, Christian, Zankl, Tobias, Robl, Werner and Matysik, Frank-Michael (2019) Material contrast studies of conductive thin films on semiconductor substrates using scanning electrochemical microscopy. Journal of Applied Electrochemistry 49 (5), pp. 455-463. Fulltext not available.

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