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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-253162
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.25316
Alternative Links zum Volltext:DOI
Zusammenfassung
The atomic force microscope images surfaces by sensing the forces between a sharp tip and a sample. If the tip-sample interaction is dominated by short-range forces due to the formation of covalent bonds, the image of an individual atom should reflect the angular symmetry of the interaction. Here, we report on a distinct substructure in the images of individual adatoms on silicon (111)-(7×7), two ...
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