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Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy

Giessibl, Franz J. and Hembacher, Stefan and Bielefeldt, Hartmut and Mannhart, Jochen (2000) Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy. Science 289 (5478), pp. 422-425.

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Abstract

The atomic force microscope images surfaces by sensing the forces between a sharp tip and a sample. If the tip-sample interaction is dominated by short-range forces due to the formation of covalent bonds, the image of an individual atom should reflect the angular symmetry of the interaction. Here, we report on a distinct substructure in the images of individual adatoms on silicon (111)-(7×7), two ...

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Item Type:Article
Date:2000
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1126/science.289.5478.422DOI
Keywords:
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner: Petra Wild
Deposited On:10 Jul 2012 13:57
Last Modified:13 Sep 2012 12:27
Item ID:25316
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